Scanning electron microscopy has become a popular imaging tool in different areas of science and engineering [1–7]. Being able to elucidate the structure of a material at the micro-and/or the nano-scale level is indeed crucial to characterizing the material, understanding its mechanism and mode of formation, and explaining/predicting its properties and performance under a given set of environmental or load conditions [1, 2, 3, 8,9]. Secondary electron imaging is commonly used to reveal surface topography, grain ...

see the attached file

العنوان

Application Note # 5991-0791EN, Agilent Technologies, Inc., 2012, 8p.

الناشر

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بلد الناشر

فلسطين

نوع المنشور

Both (Printed and Online)

المجلد

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السنة

2012

الصفحات

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