Effective Pattern Representation for Safety Critical Embedded Systems
- Publication Type
- Original research
- Authors
- Ashraf Armoush
- F. Salewski
- S. Kowalewski
-
Journal
- Title
- 2008 International Conference on Computer Science and Software Engineering, 2008, pp. 91-97
- Publisher
- --
- Publisher Country
- Palestine
- Publication Type
- Both (Printed and Online)
- Volume
- --
- Year
- 2008
- Pages
- --